NU-T1810/NU-T1810A Split Beam UV/Vis UV/VIS Spectrophotometer
Brand:NANBEI
Model:NU-T1810/NU-T1810A Split Beam UV/Vis UV/VIS Spectrophotometer
Application:Teaching research,environmental detection,optical material,metallic material,food safety,daily chemical products,agriculture,drug
T1810 Series Split Beam UV/Vis UV/VIS Spectrophotometer
Characteristics of spectrophotometer:
● High Accuracy: Using grating micrometer level precision screw drive to ensure the accuracy of wavelength <±0.3nm;Transmittance of accuracy reaches ±0.3%.
● Convenience for use: 5.7 inch graphic LCD display. Spectrum curve be clear at a glance and easy to operate. There is quantitative analysis、qualitative analysis、 kinetics test、 DNA/RNA、 multi- wavelength analysis in special purpose testing program.
● Service life durable: Imported Halogen lamp ensures the light source for up two years of life, receiver life for 20 years.
●Wide application fields: Optional Equipped with Peltier/sipper unit, with Micro cell holder, with (5°incident angle) Reflectance measurement attachment etc. expands the application areas of more.
Function of of spectrophotometer:
●Photometric measurement: Convenience to measure samples in the specified wavelength absorbance and transmittance. Multi-wavelength detector is maximum simultaneous determination of 10 wavelengths.
●Quantitative measurement: Establish automatically standard curve, first- order \ first after we order the third order curve fitting. Optional method: Single wavelength calibration、Double wavelength calibration、Three point method,
●Qualitative measurement: Including scaling, smoothing, filtering, detecting peak-valley etc.
●Kinetics measurement: Calculate kinetics of enzyme reaction rate.
Model |
NU-T1810 |
NU-T1810A |
Optical System |
Split beam, Littrow,Grating 1200 line/mm |
Wavelength Range |
190~1100nm |
Spectral Bandwidth |
1.8nm |
1nm |
Wavelength Accuracy |
±0.3nm |
Wavelength Repeatability |
±0.1nm |
Photometric Accuracy |
±0.3%T;±0.002Abs(0~0.5Abs);±0.004(0.5-1.0Abs); |
Photometric Repeatability |
±0.1%T;±0.001Abs(0~0.5Abs);±0.002(0.5-1.0Abs); |
Stray Light |
≤0.05%T, @220nm/360nm |
Noise Level |
±0.0015Abs |
Stability |
±0.0015A/h@500nm |
Baseline Flatness |
±0.0015Abs |
Baseline Dark Noise |
0.1%T |
Photometric Range |
0~200℅T,-4~4A,0~9999C(0-9999F) |
Light Source |
Tungsten&Deuterium Lamp(Pre-aligned) |
Scan Speed |
Hi,MED.,LOW.,MAX.3600nm/min
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